Fabrikantnummer

onsemi Programmable Delay 12.2 ns Delay Line 32-Pin LQFP

Name: onsemi Programmable Delay 12.2 ns Delay Line 32-Pin LQFP
Brand: onsemi
SKU: 186-8830
Price: 18.43 EUR
Availability: InStock

Subtotaal (1 tray van 250 eenheden)*

€ 3.807,00

(excl. BTW)

€ 4.606,50

(incl. BTW)

Bestellingen onder € 75,00 (excl. BTW) € 5,95.

Op voorraad

Heeft u meer nodig? Klik op 'Controleer leverdata' voor extra voorraad en levertijden.

Aantal stuks	Per stuk	Per tray*
250 +	€ 15,228	€ 3.807,00

*prijsindicatie

Specificaties

Datasheets

Wetgeving en compliance

Productomschrijving

Zoek vergelijkbare producten door een of meer kenmerken te selecteren.

Alles selecteren	Attribuut	Waarde
	Merk	onsemi
	Product Type	Delay Line
	Sub Type	Programmable Delay
	Mount Type	Surface
	Package Type	LQFP
	Minimum Supply Voltage	3V
	Pin Count	32
	Maximum Supply Voltage	3.6V
	Number of Taps/Steps	1024
	Total Delay Time	12.2ns
	Delay to First Tap/Step	2.2ns
	Minimum Operating Temperature	-40°C
	Number of Independent Delays	10
	Maximum Operating Temperature	85°C
	Width	7 mm
	Length	7mm
	Height	1.45mm
	Series	MC100EP195
	Standards/Approvals	No
	Automotive Standard	No

	Alles selecteren
	Merk onsemi
	Product Type Delay Line
	Sub Type Programmable Delay
	Mount Type Surface
	Package Type LQFP
	Minimum Supply Voltage 3V
	Pin Count 32
	Maximum Supply Voltage 3.6V
	Number of Taps/Steps 1024
	Total Delay Time 12.2ns
	Delay to First Tap/Step 2.2ns
	Minimum Operating Temperature -40°C
	Number of Independent Delays 10
	Maximum Operating Temperature 85°C
	Width 7 mm
	Length 7mm
	Height 1.45mm
	Series MC100EP195
	Standards/Approvals No
	Automotive Standard No

Maximum Frequency > 1.2 Ghz Typical

Programmable Range: 2.2 ns to 12.2 ns

10 ps Increments

PECL Mode Operating Range: VCC = 3.0 V with VEE = 0 V

NECL Mode Operating Range: VCC = 0 V with VEE = -3.0 V

Open Input Default State

Safety Clamp on Inputs

A Logic High on the ENbar Pin Will Force Q to Logic Low

D[0:10] Can Accept Either ECL, CMOS, or TTL Inputs.

VBB Output Reference Voltage

Applications

Automated Test Equipement (ATE)

General Purpose Data and Clock Interface

Gerelateerde Links