Infineon CoolSiC Type N-Channel MOSFET, 32 A, 750 V Enhancement, 4-Pin PG-TO247-4 IMZA75R060M1HXKSA1

Bulkkorting beschikbaar

Subtotaal (1 eenheid)*

€ 9,83

(excl. BTW)

€ 11,89

(incl. BTW)

Add to Basket
selecteer of typ hoeveelheid
Op voorraad
  • 240 stuk(s) klaar voor verzending vanaf een andere locatie
Heeft u meer nodig? Klik op 'Controleer leverdata' voor extra voorraad en levertijden.
Aantal stuks
Per stuk
1 - 9€ 9,83
10 - 99€ 8,85
100 - 499€ 8,16
500 - 999€ 7,56
1000 +€ 6,79

*prijsindicatie

RS-stocknr.:
349-344
Fabrikantnummer:
IMZA75R060M1HXKSA1
Fabrikant:
Infineon
Zoek vergelijkbare producten door een of meer kenmerken te selecteren.
Alles selecteren

Merk

Infineon

Product Type

MOSFET

Channel Type

Type N

Maximum Continuous Drain Current Id

32A

Maximum Drain Source Voltage Vds

750V

Package Type

PG-TO247-4

Series

CoolSiC

Mount Type

Through Hole

Pin Count

4

Maximum Drain Source Resistance Rds

78mΩ

Channel Mode

Enhancement

Maximum Gate Source Voltage Vgs

23 V

Maximum Power Dissipation Pd

144W

Minimum Operating Temperature

-55°C

Typical Gate Charge Qg @ Vgs

23nC

Maximum Operating Temperature

175°C

Standards/Approvals

RoHS

Automotive Standard

No

Land van herkomst:
CN
The Infineon 750 V CoolSiC Power Device G1 is built on Infineon’s solid silicon carbide technology, developed over more than 20 years. By leveraging the unique characteristics of wide bandgap SiC materials, the 750 V CoolSiC MOSFET delivers a unique combination of performance, reliability, and ease of use. It is specifically designed for high temperature and harsh operating conditions, enabling the simplified and cost effective deployment of systems with the highest efficiency. This MOSFET is perfect for applications requiring robust performance and energy efficient solutions.

Enhanced robustness and reliability for bus voltages beyond 500 V

Superior efficiency in hard switching

Higher switching frequency in soft switching topologies

Robustness against parasitic turn on for unipolar gate driving

Reduced switching losses through improved gate control

Gerelateerde Links